CD4011B NAND gates provide the system designer with direct implementation of the NAND function and supplement the existing family of CMOS gates. All inputs and outputs are buffered.

Features:

• Propagation delay time = 60 ns (typ.) at CL = 50 pF, VDD = 10 V
• Buffered inputs and outputs
• Standardized symmetrical output characteristics
• Maximum input current of 1 µA at 18 V over-full package temperature range; 100 nA at 18 V and 25°C
• 100% tested for quiescent current at 20 V
• 5-V, 10-V, and 15-V parametric ratings
• Noise margin (over full package temperature range:
  • 1 V at VDD = 5 V
  • 2 V at VDD = 10 V
  • 2.5 at VDD = 15 V
• Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of "B" Series CMOS Devices"